
The Story
Ge Wafer Specification
- Growing Method: CZ
- Orientation: (110) +/-0.7 Deg.
- Wafer Size: 3" dia x 0.5 mm
- Surface Polishing: two sides optical polished
- Surface finish (RMS or Ra) : < 30A
- Doping: Undoped
- Conductor type: N-type
- Resistivity: >50 Ohms/cm (If you would like to measure the resistivity accurately,
please order our Portable 4 Probe Resistivity Testing Instrument.)
Description
Ge Wafer Specification
- Growing Method: CZ
- Orientation: (110) +/-0.7 Deg.
- Wafer Size: 3" dia x 0.5 mm
- Surface Polishing: two sides optical polished
- Surface finish (RMS or Ra) : < 30A
- Doping: Undoped
- Conductor type: N-type
- Resistivity: >50 Ohms/cm (If you would like to measure the resistivity accurately,
please order our Portable 4 Probe Resistivity Testing Instrument.)












